Hidden stripe pattern lets microscopes auto-focus across 400 times deeper range
A new autofocus technique called Digital Defocus Aberration Interference (DAbI) has been developed by scientists at Caltech. This method allows microscopes to maintain focus across a range more than 400 times larger than traditional lenses. The technique has shown promising results across various types of microscopes and samples, enhancing the efficiency of high-throughput microscopy.
- ▪DAbI uses two LEDs illuminating a sample from different angles to create a fringe pattern that helps correct blurriness.
- ▪The technique has been tested on six types of microscopes, achieving excellent results.
- ▪DAbI can focus on thick 3D samples up to 150 micrometers deep, offering a range nearly 300 times larger than traditional methods.
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April 28, 2026 Hidden stripe pattern lets microscopes auto-focus across 400 times deeper range by California Institute of Technology edited by Stephanie Baum, reviewed by Andrew Zinin Stephanie Baum Scientific Editor Meet our editorial team Behind our editorial process Andrew Zinin Lead Editor Meet our editorial team Behind our editorial process Editors' notes This article has been reviewed according to Science X's editorial process and policies. Editors have highlighted the following attributes while ensuring the content's credibility: fact-checked peer-reviewed publication trusted source proofread The GIST Add as preferred source Fourier spectrum of an intensity image under an oblique illumination angle. Credit: Nature Communications (2026).
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